Semiconductor Integrated Circuit
3D visualization of a surface measured with an atomic force microscope
The AFM measured height data is visualized with 3D AFM/SPM software .
The height of the features is exaggerated for better perception of the fine structures measured at the sample.

With Distance and Volume measuring tools
Visualized with   .:3D AFM/SPM control:.
Visualized with   .:3D AFM/SPM control:.

Elevation contour 

Single AFM surface
Multiple Surface PRO samples

Back to 3D AFM Graphics

ATI™ is used under license and is a registered trademark of ATI Technologies Inc. in the United States and other countries.
OpenGL is a registered trademark of SGI

Copyright © 2003-2013 ScienceGL, Inc.